Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Sekiguchi, Tetsuhiro; Baba, Yuji; Shimoyama, Iwao; Wu, G.*; Kitajima, Yoshinori*
Surface Science, 593(1-3), p.310 - 317, 2005/11
Times Cited Count:2 Percentile:11.64(Chemistry, Physical)Using a newly developed rotatable time-of-flight mass spectrometer(R-TOF-MS) and polarized synchrotron radiation, orientation effect on fragmentation and desorption pathways occurring at the top-most layers of molecular solids have been investigated. Reported will be polarization-angle dependencies of TOF mass spectra, high-resolution electron- and ion-NEXAFS in condensed chlorobenzene.
Ikeura, Hiromi*; Sekiguchi, Tetsuhiro; Baba, Yuji; Imamura, Motoyasu*; Matsubayashi, Nobuyuki*; Shimada, Hiromichi*
Surface Science, 593(1-3), p.303 - 309, 2005/11
Times Cited Count:5 Percentile:26.1(Chemistry, Physical)no abstracts in English
Sekiguchi, Tetsuhiro; Sekiguchi, Hiromi*; Baba, Yuji
Surface Science, 454-456, p.363 - 368, 2000/05
Times Cited Count:23 Percentile:72.41(Chemistry, Physical)no abstracts in English
Tokuda, Shinji; *
JAERI-Research 96-057, 62 Pages, 1996/11
no abstracts in English
; ; ; ;
JAERI-M 82-156, 17 Pages, 1982/11
no abstracts in English
; ;
Journal of Nuclear Science and Technology, 19(2), p.158 - 165, 1982/00
Times Cited Count:22 Percentile:87.4(Nuclear Science & Technology)no abstracts in English
; ;
JAERI-M 9681, 19 Pages, 1981/09
no abstracts in English
; ;
JAERI-M 9445, 37 Pages, 1981/04
no abstracts in English
; ;
Journal of Nuclear Science and Technology, 18(9), p.705 - 717, 1981/00
Times Cited Count:39 Percentile:95.7(Nuclear Science & Technology)no abstracts in English
; ;
Journal of Nuclear Science and Technology, 18(10), p.802 - 810, 1981/00
Times Cited Count:15 Percentile:84.09(Nuclear Science & Technology)no abstracts in English
; ; ; ;
JAERI-M 8497, 27 Pages, 1979/10
no abstracts in English
; ;
JAERI-M 8081, 26 Pages, 1979/02
no abstracts in English
; ; ;
Journal of Nuclear Science and Technology, 15(10), p.736 - 744, 1978/10
Times Cited Count:16no abstracts in English